research

Main Scientific Areas of Research:

 

Awards:

 

· Development and project of Gaussian and uniform noise generators to perform on-chip, built-in self-test (BIST) and built-in self-calibration (BISC) of ADCs.

· Implementation and testing of complex digital systems on reconfigurable circuits.

· Study and measurements of the AC magnetic susceptibility at high temperatures and low-temperature resistivity of magnetic materials.

 

2012 - Outstanding Young Author Award

The "IEEE Outstanding Young Author Award" honours a single article, exceptionally meritorious, published in the previous three years (2009-2011), one (or several) researcher (s) under the age of 30 years, in every magazine of the Society of the IEEE Circuits and Systems (CASS). Article: “A Two-Stage Fully-Differential Inverter-based Self-Biased CMOS Amplifier with High Efficiency”; M. Figueiredo, R. Santos-Tavares, E. Santin, J. Ferreira, G. Evans and, J. Goes. IEEE Transactions on Circuits and Systems - Part I: Regular Papers, pp. 1591-1603, Vol. 58, Nº 7, DOI: 10.1109/TCSI.2011.2150910, June 2011.

1993 - Prémio de Inovação

Assigned by Associação Nacional de Industriais de Material Eléctrico e Electrónico, due to the interest, novelty and usefulness of the work BRICORK – Broqueamento Inteligente de Rolhas de Cortiça, presented in ENDIEL (Encontro Nacional para o Desenvolvimento das Indústrias Eléctricas e Electrónicas).

Patent:

 

EP 1 473 836 B1 - Digital-Domain Self-Calibration and Built-in Self-Testing Techniques for High-Speed Integrated A/D Converters Using White Gaussian Noise”, N. Paulino, M. D. Ortigueira, M. Unterweissacher, G. Evans and, J. Goes, European Patent Office, August 2,  2006.

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Contacts:

Guiomar Evans

Assistant Professor

Institutional Address: Departamento de Física, Faculdade de Ciências da Universidade de Lisboa, Campo Grande, Ed. C8, 1749-016 Lisboa, Portugal 
Telephone: + (315) 217 500 910 
Email: gevans@fc.ul.pt